Continuous testing and monitoring of devices is required to guarantee optimal performance, reliability and safety throughout their operation, he explains. Tessent In-System Test enables the application of high-quality deterministic test patterns for in-system/in-field testing during the lifecycle of your chip.

Learn more about ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) testing and using SSN (Streaming Scan Network) and Siemens’ Tessent In-System Test software.

Thank you to Lee for his time.

Video: David Berman, emap

See also: Catch up with all our full video interviews from the Siemens Tech Day event in Munich.